Measuring. Monitoring. Management. Control

Measuring. Monitoring. Management. Control

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Background. Currently, semiconductor structures and devices are used in many industries, in particular electronics, telecommunications, and instrumentation. This article discusses a method for experimentally determining their parameters by measuring the volt-ampere characteristics of semiconductor...

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Bibliographic Details
Main Authors:	E.A. Pecherskaya, O.V. Karpanin, D.E. Nelyutskovа, A.M. Metalnikov, U.S. Chikhrina
Format:	Article
Language:	English
Published:	Penza State University Publishing House 2024-12-01
Series:	Измерение, мониторинг, управление, контроль
Subjects:	information and measurement system measurement automation semiconductor components diode research volt-ampere characteristic
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