Measuring. Monitoring. Management. Control
Background. Currently, semiconductor structures and devices are used in many industries, in particular electronics, telecommunications, and instrumentation. This article discusses a method for experimentally determining their parameters by measuring the volt-ampere characteristics of semiconductor...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Penza State University Publishing House
2024-12-01
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| Series: | Измерение, мониторинг, управление, контроль |
| Subjects: | |
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