Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments
Experimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electri...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1988-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1988/54096 |
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| _version_ | 1832564632365039616 |
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| author | F. Müller M. Wolf |
| author_facet | F. Müller M. Wolf |
| author_sort | F. Müller |
| collection | DOAJ |
| description | Experimental results concerning the dependence of the sheet resistivity and the noise
coefficient on the grain size and the volume fraction, respectively, of the metallic-like
component in Bi2Ru2O7-based thick-film resistors are presented. The results are
compared with current models for the electrical conduction mechanism in these
resistors. |
| format | Article |
| id | doaj-art-bd767aafd9de4a0eba23fd8285a93adb |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1988-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-bd767aafd9de4a0eba23fd8285a93adb2025-02-03T01:10:33ZengWileyActive and Passive Electronic Components0882-75161563-50311988-01-011311610.1155/1988/54096Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors ExperimentsF. Müller0M. Wolf1Zentralinstitut für Festkörperphysik und Werkstofforschung der Akademie der Wissensenchaften der DDR, Dresden, GermanyZentralinstitut für Festkörperphysik und Werkstofforschung der Akademie der Wissensenchaften der DDR, Dresden, GermanyExperimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electrical conduction mechanism in these resistors.http://dx.doi.org/10.1155/1988/54096 |
| spellingShingle | F. Müller M. Wolf Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments Active and Passive Electronic Components |
| title | Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments |
| title_full | Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments |
| title_fullStr | Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments |
| title_full_unstemmed | Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments |
| title_short | Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments |
| title_sort | dependence of the sheet resistivity and current noise behaviour of the grain size and volume fraction of conducting material in thick film resistors experiments |
| url | http://dx.doi.org/10.1155/1988/54096 |
| work_keys_str_mv | AT fmuller dependenceofthesheetresistivityandcurrentnoisebehaviourofthegrainsizeandvolumefractionofconductingmaterialinthickfilmresistorsexperiments AT mwolf dependenceofthesheetresistivityandcurrentnoisebehaviourofthegrainsizeandvolumefractionofconductingmaterialinthickfilmresistorsexperiments |