Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments

Experimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electri...

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Bibliographic Details
Main Authors: F. Müller, M. Wolf
Format: Article
Language:English
Published: Wiley 1988-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/1988/54096
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