Taylor Expansion of Surface Potential in MOSFET: Application to Pao-Sah Integral

We propose a simple model, derived from Pao-Sah theory, valid in all modes from weak to strong inversion, to calculate the drain current in Metal Oxide Semiconductor Field Effect Transistor (MOSFET). The Pao-Sah double integral is decomposed into single integrals with limits of integration calculate...

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Main Authors: Hugues Murray, Patrick Martin, Serge Bardy
Format: Article
Language:English
Published: Wiley 2010-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/2010/268431
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author Hugues Murray
Patrick Martin
Serge Bardy
author_facet Hugues Murray
Patrick Martin
Serge Bardy
author_sort Hugues Murray
collection DOAJ
description We propose a simple model, derived from Pao-Sah theory, valid in all modes from weak to strong inversion, to calculate the drain current in Metal Oxide Semiconductor Field Effect Transistor (MOSFET). The Pao-Sah double integral is decomposed into single integrals with limits of integration calculated from Taylor polynomials of inverse functions. The solution is presented analytically wherever possible, and the integration is made from simple numerical methods (Simpson, Romberg) or adaptative algorithms and can be implemented in simple C-program or in usual mathematical software. The transconductance and the diffusion current are also calculated with the same model.
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institution Kabale University
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spelling doaj-art-077a1b47bfde4efeba1992dd4ac751092025-02-03T06:08:35ZengWileyActive and Passive Electronic Components0882-75161563-50312010-01-01201010.1155/2010/268431268431Taylor Expansion of Surface Potential in MOSFET: Application to Pao-Sah IntegralHugues Murray0Patrick Martin1Serge Bardy2LaMIPS, Laboratoire commun NXP-CRISMAT, UMR 6508 CNRS ENSICAEN, UCBN, 2, rue de la Girafe BP 5120, F-14079 Caen Cedex 5, FranceLaMIPS, Laboratoire commun NXP-CRISMAT, UMR 6508 CNRS ENSICAEN, UCBN, 2, rue de la Girafe BP 5120, F-14079 Caen Cedex 5, FranceNXP Semiconductors 2, Esplanade Anton Philips Campus Effiscience, Colombelles, BP 20 000 14906 Caen Cedex 9, FranceWe propose a simple model, derived from Pao-Sah theory, valid in all modes from weak to strong inversion, to calculate the drain current in Metal Oxide Semiconductor Field Effect Transistor (MOSFET). The Pao-Sah double integral is decomposed into single integrals with limits of integration calculated from Taylor polynomials of inverse functions. The solution is presented analytically wherever possible, and the integration is made from simple numerical methods (Simpson, Romberg) or adaptative algorithms and can be implemented in simple C-program or in usual mathematical software. The transconductance and the diffusion current are also calculated with the same model.http://dx.doi.org/10.1155/2010/268431
spellingShingle Hugues Murray
Patrick Martin
Serge Bardy
Taylor Expansion of Surface Potential in MOSFET: Application to Pao-Sah Integral
Active and Passive Electronic Components
title Taylor Expansion of Surface Potential in MOSFET: Application to Pao-Sah Integral
title_full Taylor Expansion of Surface Potential in MOSFET: Application to Pao-Sah Integral
title_fullStr Taylor Expansion of Surface Potential in MOSFET: Application to Pao-Sah Integral
title_full_unstemmed Taylor Expansion of Surface Potential in MOSFET: Application to Pao-Sah Integral
title_short Taylor Expansion of Surface Potential in MOSFET: Application to Pao-Sah Integral
title_sort taylor expansion of surface potential in mosfet application to pao sah integral
url http://dx.doi.org/10.1155/2010/268431
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