Explicit Function Model of Electromagnetic Reliability for CMOS Inverters Under HPM Coupling Based on Physical Mechanism Analysis and Neural Network Algorithm
Currently, commonly used compact device models for CMOS inverters lack an explicit functional model that can efficiently describe the specific physical processes of HPM-coupled voltage excitation damaging the inverter. This paper proposes an explicit function model that describes the failure process...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10616156/ |
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