Measuring. Monitoring. Management. Control
Background. Currently, semiconductor structures and devices are used in many industries, in particular electronics, telecommunications, and instrumentation. This article discusses a method for experimentally determining their parameters by measuring the volt-ampere characteristics of semiconductor...
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| Format: | Article |
| Language: | English |
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Penza State University Publishing House
2024-12-01
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| Series: | Измерение, мониторинг, управление, контроль |
| Subjects: | |
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| _version_ | 1832544451006824448 |
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| author | E.A. Pecherskaya O.V. Karpanin D.E. Nelyutskovа A.M. Metalnikov U.S. Chikhrina |
| author_facet | E.A. Pecherskaya O.V. Karpanin D.E. Nelyutskovа A.M. Metalnikov U.S. Chikhrina |
| author_sort | E.A. Pecherskaya |
| collection | DOAJ |
| description | Background. Currently, semiconductor structures and devices are used in many industries, in particular electronics,
telecommunications, and instrumentation. This article discusses a method for experimentally determining their
parameters by measuring the volt-ampere characteristics of semiconductors using an automated information and measurement
system. The purpose of the work is to study the electrophysical parameters of semiconductor components and
describe the measurement technique used as the basis of the measuring system. Materials and methods. The automated
information and measurement system is designed to study various semiconductor components and products, such asintegrated circuits, microcircuits, diodes, transistors, solar cells, zener diodes, charge-coupled devices, solar cells. All these
components are used in electronics, mechanical engineering, optoelectronics and signal processing systems. Results. The
volt-ampere characteristic was measured using the example of a semiconductor component (diode 2D212B), and the
results obtained were analyzed, presented in tabular and graphical form. Conclusions. The structure of an automated information
and measurement system is presented, which contains a measuring unit and a computer that controls measurements
and automated processing of measurement results in order to determine the electrophysical parameters of the
structures under study according to the measured volt-ampere characteristic. |
| format | Article |
| id | doaj-art-fa70aef29fb34ff2b050dd3a7141e1d5 |
| institution | Kabale University |
| issn | 2307-5538 |
| language | English |
| publishDate | 2024-12-01 |
| publisher | Penza State University Publishing House |
| record_format | Article |
| series | Измерение, мониторинг, управление, контроль |
| spelling | doaj-art-fa70aef29fb34ff2b050dd3a7141e1d52025-02-03T10:24:13ZengPenza State University Publishing HouseИзмерение, мониторинг, управление, контроль2307-55382024-12-01412312810.21685/2307-5538-2024-4-14Measuring. Monitoring. Management. ControlE.A. Pecherskaya0O.V. Karpanin1D.E. Nelyutskovа2A.M. Metalnikov3U.S. Chikhrina4Penza State UniversityPenza State UniversityPenza State UniversityPenza State UniversityPenza State UniversityBackground. Currently, semiconductor structures and devices are used in many industries, in particular electronics, telecommunications, and instrumentation. This article discusses a method for experimentally determining their parameters by measuring the volt-ampere characteristics of semiconductors using an automated information and measurement system. The purpose of the work is to study the electrophysical parameters of semiconductor components and describe the measurement technique used as the basis of the measuring system. Materials and methods. The automated information and measurement system is designed to study various semiconductor components and products, such asintegrated circuits, microcircuits, diodes, transistors, solar cells, zener diodes, charge-coupled devices, solar cells. All these components are used in electronics, mechanical engineering, optoelectronics and signal processing systems. Results. The volt-ampere characteristic was measured using the example of a semiconductor component (diode 2D212B), and the results obtained were analyzed, presented in tabular and graphical form. Conclusions. The structure of an automated information and measurement system is presented, which contains a measuring unit and a computer that controls measurements and automated processing of measurement results in order to determine the electrophysical parameters of the structures under study according to the measured volt-ampere characteristic.information and measurement systemmeasurement automationsemiconductor componentsdiode researchvolt-ampere characteristic |
| spellingShingle | E.A. Pecherskaya O.V. Karpanin D.E. Nelyutskovа A.M. Metalnikov U.S. Chikhrina Measuring. Monitoring. Management. Control Измерение, мониторинг, управление, контроль information and measurement system measurement automation semiconductor components diode research volt-ampere characteristic |
| title | Measuring. Monitoring. Management. Control |
| title_full | Measuring. Monitoring. Management. Control |
| title_fullStr | Measuring. Monitoring. Management. Control |
| title_full_unstemmed | Measuring. Monitoring. Management. Control |
| title_short | Measuring. Monitoring. Management. Control |
| title_sort | measuring monitoring management control |
| topic | information and measurement system measurement automation semiconductor components diode research volt-ampere characteristic |
| work_keys_str_mv | AT eapecherskaya measuringmonitoringmanagementcontrol AT ovkarpanin measuringmonitoringmanagementcontrol AT denelyutskova measuringmonitoringmanagementcontrol AT ammetalnikov measuringmonitoringmanagementcontrol AT uschikhrina measuringmonitoringmanagementcontrol |