Statistical Analysis of Data From Electronic Component Lifetests (A Tutorial Paper)
Methods of statistically analysing data from electronic component lifetests are discussed. Particular emphasis is given to analysis techniques using the assumptions of constant hazard rate (Exponential distribution), the Weibull distribution and mixed Weibull distributions. The methods used for anal...
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1987-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1987/23687 |
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| _version_ | 1832560568652791808 |
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| author | J. Møltoft |
| author_facet | J. Møltoft |
| author_sort | J. Møltoft |
| collection | DOAJ |
| description | Methods of statistically analysing data from electronic component lifetests are discussed. Particular emphasis is given to
analysis techniques using the assumptions of constant hazard rate (Exponential distribution), the Weibull distribution
and mixed Weibull distributions. The methods used for analysing Weibull data when the data itself is non-uniform due
to both removal of test samples during test and also the non-continuance of surveillance of components under test are
discussed. Attention is finally given to the effect of two or more failure mechanisms which can produce S-shaped
patterns when data is plotted on Weibull Graph paper. |
| format | Article |
| id | doaj-art-f639bd38d838455b9122e6a393d6b8f8 |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1987-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-f639bd38d838455b9122e6a393d6b8f82025-02-03T01:27:15ZengWileyActive and Passive Electronic Components0882-75161563-50311987-01-0112425927910.1155/1987/23687Statistical Analysis of Data From Electronic Component Lifetests (A Tutorial Paper)J. Møltoft0Danish Engineering Academyt, Mechatronics Section, Bygning 451, Lyngby DK 2800 , DenmarkMethods of statistically analysing data from electronic component lifetests are discussed. Particular emphasis is given to analysis techniques using the assumptions of constant hazard rate (Exponential distribution), the Weibull distribution and mixed Weibull distributions. The methods used for analysing Weibull data when the data itself is non-uniform due to both removal of test samples during test and also the non-continuance of surveillance of components under test are discussed. Attention is finally given to the effect of two or more failure mechanisms which can produce S-shaped patterns when data is plotted on Weibull Graph paper.http://dx.doi.org/10.1155/1987/23687 |
| spellingShingle | J. Møltoft Statistical Analysis of Data From Electronic Component Lifetests (A Tutorial Paper) Active and Passive Electronic Components |
| title | Statistical Analysis of Data From Electronic Component Lifetests (A
Tutorial Paper) |
| title_full | Statistical Analysis of Data From Electronic Component Lifetests (A
Tutorial Paper) |
| title_fullStr | Statistical Analysis of Data From Electronic Component Lifetests (A
Tutorial Paper) |
| title_full_unstemmed | Statistical Analysis of Data From Electronic Component Lifetests (A
Tutorial Paper) |
| title_short | Statistical Analysis of Data From Electronic Component Lifetests (A
Tutorial Paper) |
| title_sort | statistical analysis of data from electronic component lifetests a tutorial paper |
| url | http://dx.doi.org/10.1155/1987/23687 |
| work_keys_str_mv | AT jmøltoft statisticalanalysisofdatafromelectroniccomponentlifetestsatutorialpaper |