Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite

Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite

Nanoindentation (NI) and atomic force microscopy (AFM) nanoindentation, coupled with polarized light microscopy (PLM), were used to determine the nano-/micromechanical behavior of the amorphous regions and individual crystalline structures, both spherulites and transcrystalline (TC) layers, in PEEK...

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Bibliographic Details
Main Authors: Sophie Vanpée, Bernard Nysten, Jérémy Chevalier, Thomas Pardoen
Format: Article
Language:English
Published: Elsevier 2025-02-01
Series:Polymer Testing
Subjects:
Semi-crystalline composite
Microstructure
Nanoindentation
Atomic force microscopy
Online Access:http://www.sciencedirect.com/science/article/pii/S0142941825000285
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