Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite
Nanoindentation (NI) and atomic force microscopy (AFM) nanoindentation, coupled with polarized light microscopy (PLM), were used to determine the nano-/micromechanical behavior of the amorphous regions and individual crystalline structures, both spherulites and transcrystalline (TC) layers, in PEEK...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-02-01
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| Series: | Polymer Testing |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S0142941825000285 |
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