Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite
Nanoindentation (NI) and atomic force microscopy (AFM) nanoindentation, coupled with polarized light microscopy (PLM), were used to determine the nano-/micromechanical behavior of the amorphous regions and individual crystalline structures, both spherulites and transcrystalline (TC) layers, in PEEK...
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Elsevier
2025-02-01
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Series: | Polymer Testing |
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Online Access: | http://www.sciencedirect.com/science/article/pii/S0142941825000285 |
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author | Sophie Vanpée Bernard Nysten Jérémy Chevalier Thomas Pardoen |
author_facet | Sophie Vanpée Bernard Nysten Jérémy Chevalier Thomas Pardoen |
author_sort | Sophie Vanpée |
collection | DOAJ |
description | Nanoindentation (NI) and atomic force microscopy (AFM) nanoindentation, coupled with polarized light microscopy (PLM), were used to determine the nano-/micromechanical behavior of the amorphous regions and individual crystalline structures, both spherulites and transcrystalline (TC) layers, in PEEK samples containing few carbon fibers. To this aim, thin model samples with a controlled thickness were manufactured to allow both microstructure characterization in transmission mode and indentation tests without substrate effects. Surface roughness of the model samples was carefully minimized to get reliable and low dispersion from indentation experiments. The artefacts and sources of uncertainty of performing indentation experiments on thin polymer films containing some fibers are also discussed. The AFM nanoindentation added value is the possibility of evaluating the mechanical behavior of crystalline structures at the nanoscale, for the determination of mechanical behavior heterogeneities at the intra-spherulitic and intra-transcrystalline scale. |
format | Article |
id | doaj-art-f295e537943642fcbc2891d65ef30343 |
institution | Kabale University |
issn | 1873-2348 |
language | English |
publishDate | 2025-02-01 |
publisher | Elsevier |
record_format | Article |
series | Polymer Testing |
spelling | doaj-art-f295e537943642fcbc2891d65ef303432025-02-02T05:26:37ZengElsevierPolymer Testing1873-23482025-02-01143108714Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK compositeSophie Vanpée0Bernard Nysten1Jérémy Chevalier2Thomas Pardoen3Institute of Mechanics, Materials and Civil Engineering (iMMC), UCLouvain, Place Sainte-Barbe 2, 1348, Louvain-la-Neuve, Belgium; Institute of Condensed Matter and Nanosciences (IMCN), UCLouvain, Croix du Sud 1, 1348, Louvain-la-Neuve, Belgium; Corresponding author. Institute of Mechanics, Materials and Civil Engineering (iMMC), UCLouvain, Place Sainte-Barbe 2, 1348 Louvain-la-Neuve, Belgium.Institute of Condensed Matter and Nanosciences (IMCN), UCLouvain, Croix du Sud 1, 1348, Louvain-la-Neuve, BelgiumMaterial Science Application Center (MSAC), Syensqo, Rue de la Fusée 98, 1130, Brussels, BelgiumInstitute of Mechanics, Materials and Civil Engineering (iMMC), UCLouvain, Place Sainte-Barbe 2, 1348, Louvain-la-Neuve, Belgium; WEL Research Institute, Avenue Pasteur 6, 1300, Wavre, Belgium; Corresponding author. Institute of Mechanics, Materials and Civil Engineering (iMMC), UCLouvain, Place Sainte-Barbe 2, 1348 Louvain-la-Neuve, Belgium.Nanoindentation (NI) and atomic force microscopy (AFM) nanoindentation, coupled with polarized light microscopy (PLM), were used to determine the nano-/micromechanical behavior of the amorphous regions and individual crystalline structures, both spherulites and transcrystalline (TC) layers, in PEEK samples containing few carbon fibers. To this aim, thin model samples with a controlled thickness were manufactured to allow both microstructure characterization in transmission mode and indentation tests without substrate effects. Surface roughness of the model samples was carefully minimized to get reliable and low dispersion from indentation experiments. The artefacts and sources of uncertainty of performing indentation experiments on thin polymer films containing some fibers are also discussed. The AFM nanoindentation added value is the possibility of evaluating the mechanical behavior of crystalline structures at the nanoscale, for the determination of mechanical behavior heterogeneities at the intra-spherulitic and intra-transcrystalline scale.http://www.sciencedirect.com/science/article/pii/S0142941825000285Semi-crystalline compositeMicrostructureNanoindentationAtomic force microscopy |
spellingShingle | Sophie Vanpée Bernard Nysten Jérémy Chevalier Thomas Pardoen Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite Polymer Testing Semi-crystalline composite Microstructure Nanoindentation Atomic force microscopy |
title | Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite |
title_full | Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite |
title_fullStr | Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite |
title_full_unstemmed | Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite |
title_short | Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite |
title_sort | nanoindentation analysis of transcrystalline layers in model carbon fiber reinforced peek composite |
topic | Semi-crystalline composite Microstructure Nanoindentation Atomic force microscopy |
url | http://www.sciencedirect.com/science/article/pii/S0142941825000285 |
work_keys_str_mv | AT sophievanpee nanoindentationanalysisoftranscrystallinelayersinmodelcarbonfiberreinforcedpeekcomposite AT bernardnysten nanoindentationanalysisoftranscrystallinelayersinmodelcarbonfiberreinforcedpeekcomposite AT jeremychevalier nanoindentationanalysisoftranscrystallinelayersinmodelcarbonfiberreinforcedpeekcomposite AT thomaspardoen nanoindentationanalysisoftranscrystallinelayersinmodelcarbonfiberreinforcedpeekcomposite |