Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite

Nanoindentation (NI) and atomic force microscopy (AFM) nanoindentation, coupled with polarized light microscopy (PLM), were used to determine the nano-/micromechanical behavior of the amorphous regions and individual crystalline structures, both spherulites and transcrystalline (TC) layers, in PEEK...

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Main Authors: Sophie Vanpée, Bernard Nysten, Jérémy Chevalier, Thomas Pardoen
Format: Article
Language:English
Published: Elsevier 2025-02-01
Series:Polymer Testing
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Online Access:http://www.sciencedirect.com/science/article/pii/S0142941825000285
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author Sophie Vanpée
Bernard Nysten
Jérémy Chevalier
Thomas Pardoen
author_facet Sophie Vanpée
Bernard Nysten
Jérémy Chevalier
Thomas Pardoen
author_sort Sophie Vanpée
collection DOAJ
description Nanoindentation (NI) and atomic force microscopy (AFM) nanoindentation, coupled with polarized light microscopy (PLM), were used to determine the nano-/micromechanical behavior of the amorphous regions and individual crystalline structures, both spherulites and transcrystalline (TC) layers, in PEEK samples containing few carbon fibers. To this aim, thin model samples with a controlled thickness were manufactured to allow both microstructure characterization in transmission mode and indentation tests without substrate effects. Surface roughness of the model samples was carefully minimized to get reliable and low dispersion from indentation experiments. The artefacts and sources of uncertainty of performing indentation experiments on thin polymer films containing some fibers are also discussed. The AFM nanoindentation added value is the possibility of evaluating the mechanical behavior of crystalline structures at the nanoscale, for the determination of mechanical behavior heterogeneities at the intra-spherulitic and intra-transcrystalline scale.
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series Polymer Testing
spelling doaj-art-f295e537943642fcbc2891d65ef303432025-02-02T05:26:37ZengElsevierPolymer Testing1873-23482025-02-01143108714Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK compositeSophie Vanpée0Bernard Nysten1Jérémy Chevalier2Thomas Pardoen3Institute of Mechanics, Materials and Civil Engineering (iMMC), UCLouvain, Place Sainte-Barbe 2, 1348, Louvain-la-Neuve, Belgium; Institute of Condensed Matter and Nanosciences (IMCN), UCLouvain, Croix du Sud 1, 1348, Louvain-la-Neuve, Belgium; Corresponding author. Institute of Mechanics, Materials and Civil Engineering (iMMC), UCLouvain, Place Sainte-Barbe 2, 1348 Louvain-la-Neuve, Belgium.Institute of Condensed Matter and Nanosciences (IMCN), UCLouvain, Croix du Sud 1, 1348, Louvain-la-Neuve, BelgiumMaterial Science Application Center (MSAC), Syensqo, Rue de la Fusée 98, 1130, Brussels, BelgiumInstitute of Mechanics, Materials and Civil Engineering (iMMC), UCLouvain, Place Sainte-Barbe 2, 1348, Louvain-la-Neuve, Belgium; WEL Research Institute, Avenue Pasteur 6, 1300, Wavre, Belgium; Corresponding author. Institute of Mechanics, Materials and Civil Engineering (iMMC), UCLouvain, Place Sainte-Barbe 2, 1348 Louvain-la-Neuve, Belgium.Nanoindentation (NI) and atomic force microscopy (AFM) nanoindentation, coupled with polarized light microscopy (PLM), were used to determine the nano-/micromechanical behavior of the amorphous regions and individual crystalline structures, both spherulites and transcrystalline (TC) layers, in PEEK samples containing few carbon fibers. To this aim, thin model samples with a controlled thickness were manufactured to allow both microstructure characterization in transmission mode and indentation tests without substrate effects. Surface roughness of the model samples was carefully minimized to get reliable and low dispersion from indentation experiments. The artefacts and sources of uncertainty of performing indentation experiments on thin polymer films containing some fibers are also discussed. The AFM nanoindentation added value is the possibility of evaluating the mechanical behavior of crystalline structures at the nanoscale, for the determination of mechanical behavior heterogeneities at the intra-spherulitic and intra-transcrystalline scale.http://www.sciencedirect.com/science/article/pii/S0142941825000285Semi-crystalline compositeMicrostructureNanoindentationAtomic force microscopy
spellingShingle Sophie Vanpée
Bernard Nysten
Jérémy Chevalier
Thomas Pardoen
Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite
Polymer Testing
Semi-crystalline composite
Microstructure
Nanoindentation
Atomic force microscopy
title Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite
title_full Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite
title_fullStr Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite
title_full_unstemmed Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite
title_short Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite
title_sort nanoindentation analysis of transcrystalline layers in model carbon fiber reinforced peek composite
topic Semi-crystalline composite
Microstructure
Nanoindentation
Atomic force microscopy
url http://www.sciencedirect.com/science/article/pii/S0142941825000285
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AT bernardnysten nanoindentationanalysisoftranscrystallinelayersinmodelcarbonfiberreinforcedpeekcomposite
AT jeremychevalier nanoindentationanalysisoftranscrystallinelayersinmodelcarbonfiberreinforcedpeekcomposite
AT thomaspardoen nanoindentationanalysisoftranscrystallinelayersinmodelcarbonfiberreinforcedpeekcomposite