Magnetic and Low Temperature Conductivity Studies in Oxidized Nano Ni Films
A set of single layered nanostructured Ni films of thickness, t = 25 nm, 50 nm, 75 nm and 100 nm have been deposited using electron beam gun evaporation technique at 473 K under high vacuum condition. From the grazing incidence X-ray diffraction (GIXRD) studies, NiO phase formation has been noted. G...
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| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2011-01-01
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| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2011/4/articles/jnep_2011_V3_N4_043-054.pdf |
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