New scan compression approach to reduce the test data volume

Abstract The test data volume (TDV) increases with increased target compression in scan compression and adds to the test cost. Increased TDV is the result of a dependency across scan flip‐flops (SFFs) that resulted from compression architecture, which is absent in scan mode. The SFFs have uncompress...

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Bibliographic Details
Main Authors: Pralhadrao V. Shantagiri, Rohit Kapur, Chandrasekar Shastry
Format: Article
Language:English
Published: Wiley 2021-07-01
Series:IET Computers & Digital Techniques
Subjects:
Online Access:https://doi.org/10.1049/cdt2.12020
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