Hard X-ray single-shot spectrometer of PAL-XFEL

A transmissive single-shot spectrometer has been developed to monitor shot-to-shot spectral structures in the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The established spectrometer comprises 10 µm-thick Si crystals bent to a radius of curvature of...

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Bibliographic Details
Main Authors: Sangsoo Kim, Jae Hyuk Lee, Daewoong Nam, Gisu Park, Myong-jin Kim, Intae Eom, Inhyuk Nam, Chi Hyun Shim, Jangwoo Kim
Format: Article
Language:English
Published: International Union of Crystallography 2025-01-01
Series:Journal of Synchrotron Radiation
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Online Access:https://journals.iucr.org/paper?S1600577524009779
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