WAVELET IDENTIFICATION OF 1/fPROCESS FOR THE FRACTAL DIMENSION OF MACHINED SURFACE TOPOGRAPHY

Combined with multi-scale analysis ability of wavelet, the wavelet identification of 1/f process is proposed for the characterization of machined surface topography, based on the fractal surface profile obtained by MB function, the fractal dimensions of different wavelet functions and different deco...

Full description

Saved in:
Bibliographic Details
Main Authors: WEN ShuHua, ZHAO Yue, ZHANG XueLiang, CHEN YongHui, LAN GuoSheng
Format: Article
Language:zho
Published: Editorial Office of Journal of Mechanical Strength 2019-01-01
Series:Jixie qiangdu
Subjects:
Online Access:http://www.jxqd.net.cn/thesisDetails#10.16579/j.issn.1001.9669.2019.04.003
Tags: Add Tag
No Tags, Be the first to tag this record!