Comprehensive Structural, Chemical, and Optical Characterization of Cu<sub>2</sub>ZnSnS<sub>4</sub> Films on Kapton Using the Automated Successive Ionic Layer Adsorption and Reaction Method
This study provides a comprehensive structural, chemical, and optical characterization of CZTS thin films deposited on flexible Kapton substrates via the Successive Ionic Layer Adsorption and Reaction (SILAR) method. The investigation explored the effects of varying deposition cycles (40, 60, 70, an...
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2025-01-01
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| author | Perla J. Vázquez-González Martha L. Paniagua-Chávez Lizette A. Zebadua-Chavarria Rafael Mota-Grajales C. A. Meza-Avendaño Enrique Campos-González A. Escobosa-Echavarría Yaoqiao Hu Aldo E. Pérez-Ramos Manuel-Matuz Carlos A. Hernández-Gutiérrez |
| author_facet | Perla J. Vázquez-González Martha L. Paniagua-Chávez Lizette A. Zebadua-Chavarria Rafael Mota-Grajales C. A. Meza-Avendaño Enrique Campos-González A. Escobosa-Echavarría Yaoqiao Hu Aldo E. Pérez-Ramos Manuel-Matuz Carlos A. Hernández-Gutiérrez |
| author_sort | Perla J. Vázquez-González |
| collection | DOAJ |
| description | This study provides a comprehensive structural, chemical, and optical characterization of CZTS thin films deposited on flexible Kapton substrates via the Successive Ionic Layer Adsorption and Reaction (SILAR) method. The investigation explored the effects of varying deposition cycles (40, 60, 70, and 80) and annealing treatments on the films. An X-ray diffraction (XRD) analysis demonstrated enhanced crystallinity and phase purity, particularly in films deposited with 70 cycles. These films exhibited a notable reduction in secondary phases in the as-deposited state, with further improvements observed after annealing at 400 °C and 450 °C in a sulfur atmosphere. A pole figure analysis indicates a decrease in texture disorder with annealing, suggesting improved crystalline orientation at higher temperatures. Field emission scanning electron microscopy (FE-SEM) showed enhancements in surface morphology, with increased grain size and uniformity post-annealing. Chemical uniformity was confirmed through Secondary Ion Mass Spectrometry (SIMS), Energy-Dispersive Spectroscopy (EDS), and X-ray Photoelectron Spectroscopy (XPS). XPS revealed the presence of CZTS phases alongside oxidized phases. Annealing effectively reduced secondary phases, such as ZnO, SnO<sub>2</sub>, CuO, and SO<sub>2</sub>, enhancing the CZTS phase. An optical analysis demonstrated that annealing at 200 °C in an air atmosphere reduced the band gap from 1.53 eV to 1.38 eV. In contrast, annealing at 400 °C and 450 °C in a sulfur atmosphere increased the band gap to 1.59 eV and 1.63 eV, respectively. The films exhibited p-type conductivity, as inferred from a valence band structure analysis. Density Functional Theory (DFT) calculations provided insights into the observed band gap variations, further substantiating the findings. |
| format | Article |
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| institution | Kabale University |
| issn | 2079-4991 |
| language | English |
| publishDate | 2025-01-01 |
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| series | Nanomaterials |
| spelling | doaj-art-dfcb360376fb4920b24565bfb1c31c692025-01-24T13:44:05ZengMDPI AGNanomaterials2079-49912025-01-011528510.3390/nano15020085Comprehensive Structural, Chemical, and Optical Characterization of Cu<sub>2</sub>ZnSnS<sub>4</sub> Films on Kapton Using the Automated Successive Ionic Layer Adsorption and Reaction MethodPerla J. Vázquez-González0Martha L. Paniagua-Chávez1Lizette A. Zebadua-Chavarria2Rafael Mota-Grajales3C. A. Meza-Avendaño4Enrique Campos-González5A. Escobosa-Echavarría6Yaoqiao Hu7Aldo E. Pérez-Ramos8Manuel-Matuz9Carlos A. Hernández-Gutiérrez10Tecnológico Nacional de México Campus Tuxtla, Carretera Panamericana Km 1080, Tuxtla Gutiérrez C.P. 29050, MexicoTecnológico Nacional de México Campus Tuxtla, Carretera Panamericana Km 1080, Tuxtla Gutiérrez C.P. 29050, MexicoPrograma de Nanociencias y Nanotecnología, Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Av. Instituto Politécnico Nacional 2508, México City C.P. 07360, MexicoTecnológico Nacional de México Campus Tuxtla, Carretera Panamericana Km 1080, Tuxtla Gutiérrez C.P. 29050, MexicoInstituto de Investigación e Innovación en Energías Renovables, Universidad de Ciencias y Artes de Chiapas, Libramiento Norte 1150 Col. Lajas Maciel, Tuxtla Gutiérrez C.P. 29039, MexicoDepartamento de Física, Instituto Nacional de Investigaciones Nucleares, Carretera México-Toluca s/n, La Marquesa, Ocoyoacac C.P. 52750, MexicoDepartamento Ingeniería Eléctrica—SEES, Cinvestav-IPN, México C.P. 07360, MexicoDepartment of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX 75080, USATecnológico Nacional de Mexico/I.T. de Oaxaca, Calz. Tecnológico No. 125, Oaxaca C.P. 68030, MexicoTecnológico Nacional de México Campus Tapachula, Carretera a Puerto Madero Km. 2, Centro, Tapachula de Córdova y Ordoñez C.P. 30700, MexicoTecnológico Nacional de México Campus Tuxtla, Carretera Panamericana Km 1080, Tuxtla Gutiérrez C.P. 29050, MexicoThis study provides a comprehensive structural, chemical, and optical characterization of CZTS thin films deposited on flexible Kapton substrates via the Successive Ionic Layer Adsorption and Reaction (SILAR) method. The investigation explored the effects of varying deposition cycles (40, 60, 70, and 80) and annealing treatments on the films. An X-ray diffraction (XRD) analysis demonstrated enhanced crystallinity and phase purity, particularly in films deposited with 70 cycles. These films exhibited a notable reduction in secondary phases in the as-deposited state, with further improvements observed after annealing at 400 °C and 450 °C in a sulfur atmosphere. A pole figure analysis indicates a decrease in texture disorder with annealing, suggesting improved crystalline orientation at higher temperatures. Field emission scanning electron microscopy (FE-SEM) showed enhancements in surface morphology, with increased grain size and uniformity post-annealing. Chemical uniformity was confirmed through Secondary Ion Mass Spectrometry (SIMS), Energy-Dispersive Spectroscopy (EDS), and X-ray Photoelectron Spectroscopy (XPS). XPS revealed the presence of CZTS phases alongside oxidized phases. Annealing effectively reduced secondary phases, such as ZnO, SnO<sub>2</sub>, CuO, and SO<sub>2</sub>, enhancing the CZTS phase. An optical analysis demonstrated that annealing at 200 °C in an air atmosphere reduced the band gap from 1.53 eV to 1.38 eV. In contrast, annealing at 400 °C and 450 °C in a sulfur atmosphere increased the band gap to 1.59 eV and 1.63 eV, respectively. The films exhibited p-type conductivity, as inferred from a valence band structure analysis. Density Functional Theory (DFT) calculations provided insights into the observed band gap variations, further substantiating the findings.https://www.mdpi.com/2079-4991/15/2/85SILARCZTSflexiblesolar cells |
| spellingShingle | Perla J. Vázquez-González Martha L. Paniagua-Chávez Lizette A. Zebadua-Chavarria Rafael Mota-Grajales C. A. Meza-Avendaño Enrique Campos-González A. Escobosa-Echavarría Yaoqiao Hu Aldo E. Pérez-Ramos Manuel-Matuz Carlos A. Hernández-Gutiérrez Comprehensive Structural, Chemical, and Optical Characterization of Cu<sub>2</sub>ZnSnS<sub>4</sub> Films on Kapton Using the Automated Successive Ionic Layer Adsorption and Reaction Method Nanomaterials SILAR CZTS flexible solar cells |
| title | Comprehensive Structural, Chemical, and Optical Characterization of Cu<sub>2</sub>ZnSnS<sub>4</sub> Films on Kapton Using the Automated Successive Ionic Layer Adsorption and Reaction Method |
| title_full | Comprehensive Structural, Chemical, and Optical Characterization of Cu<sub>2</sub>ZnSnS<sub>4</sub> Films on Kapton Using the Automated Successive Ionic Layer Adsorption and Reaction Method |
| title_fullStr | Comprehensive Structural, Chemical, and Optical Characterization of Cu<sub>2</sub>ZnSnS<sub>4</sub> Films on Kapton Using the Automated Successive Ionic Layer Adsorption and Reaction Method |
| title_full_unstemmed | Comprehensive Structural, Chemical, and Optical Characterization of Cu<sub>2</sub>ZnSnS<sub>4</sub> Films on Kapton Using the Automated Successive Ionic Layer Adsorption and Reaction Method |
| title_short | Comprehensive Structural, Chemical, and Optical Characterization of Cu<sub>2</sub>ZnSnS<sub>4</sub> Films on Kapton Using the Automated Successive Ionic Layer Adsorption and Reaction Method |
| title_sort | comprehensive structural chemical and optical characterization of cu sub 2 sub znsns sub 4 sub films on kapton using the automated successive ionic layer adsorption and reaction method |
| topic | SILAR CZTS flexible solar cells |
| url | https://www.mdpi.com/2079-4991/15/2/85 |
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