Webb, M., Chiang, T., Lenox, M. K., Gray, J., Ma, T., Ihlefeld, J. F., & Heron, J. T. Conductive filament formation in the failure of Hf0.5Zr0.5O2 ferroelectric capacitors. AIP Publishing LLC.
Chicago Style (17th ed.) CitationWebb, Matthew, Tony Chiang, Megan K. Lenox, Jordan Gray, Tao Ma, Jon F. Ihlefeld, and John T. Heron. Conductive Filament Formation in the Failure of Hf0.5Zr0.5O2 Ferroelectric Capacitors. AIP Publishing LLC.
MLA (9th ed.) CitationWebb, Matthew, et al. Conductive Filament Formation in the Failure of Hf0.5Zr0.5O2 Ferroelectric Capacitors. AIP Publishing LLC.
Warning: These citations may not always be 100% accurate.