Simulation and Analysis of GaN Wafer Bowing on Sapphire Substrate

During the process of heteroepitaxial growth, if the lattice constant of the growing film differs from that of the substrate, the wafer surface bows, regardless of whether the lattice mismatch occurs or not. As the growth in large-scale wafers speeds up, bowing effects are becoming more and more imp...

Full description

Saved in:
Bibliographic Details
Main Authors: Wang Bin, Qu Yu-xuan, Hu Shi-gang, Tang Zhi-jun, Li Jin, Hu Ying-lu
Format: Article
Language:English
Published: Wiley 2013-01-01
Series:Advances in Condensed Matter Physics
Online Access:http://dx.doi.org/10.1155/2013/465498
Tags: Add Tag
No Tags, Be the first to tag this record!