UV Light-Induced Response Degradation Characteristics of Silicon-Based Detectors

High energy radiation is known to potentially impact silicon-based optical sensors adversely, either permanently or reversibly [...]

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Bibliographic Details
Main Authors: Daniel Gäbler, Pablo F. Siles
Format: Article
Language:English
Published: MDPI AG 2024-09-01
Series:Proceedings
Subjects:
Online Access:https://www.mdpi.com/2504-3900/97/1/230
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