UV Light-Induced Response Degradation Characteristics of Silicon-Based Detectors
High energy radiation is known to potentially impact silicon-based optical sensors adversely, either permanently or reversibly [...]
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-09-01
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| Series: | Proceedings |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2504-3900/97/1/230 |
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