Fourier Ptychographic Microscopy with Optical Aberration Correction and Phase Unwrapping Based on Semi-Supervised Learning
Fourier ptychographic microscopy (FPM) has recently emerged as an important non-invasive imaging technique which is capable of simultaneously achieving high resolution, wide field of view, and quantitative phase imaging. However, FPM still faces challenges in the image reconstruction due to factors...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-01-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/15/1/423 |
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