Scalable Noise Characterization of Syndrome-Extraction Circuits with Averaged Circuit Eigenvalue Sampling

Characterizing the performance of noisy quantum circuits is central to the production of prototype quantum computers and can enable improved quantum error correction that exploits noise biases identified in a quantum device. We develop a scalable noise-characterization protocol suited to characteriz...

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Bibliographic Details
Main Authors: Evan T. Hockings, Andrew C. Doherty, Robin Harper
Format: Article
Language:English
Published: American Physical Society 2025-02-01
Series:PRX Quantum
Online Access:http://doi.org/10.1103/PRXQuantum.6.010334
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