Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515]
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| Format: | Article |
| Language: | English |
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Elsevier
2025-02-01
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| Series: | Case Studies in Thermal Engineering |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2214157X25000504 |
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| _version_ | 1832573250190704640 |
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| author | Mohammed Almatrafi Mohamed Ali Belaïd |
| author_facet | Mohammed Almatrafi Mohamed Ali Belaïd |
| author_sort | Mohammed Almatrafi |
| collection | DOAJ |
| format | Article |
| id | doaj-art-d3b0a65681be4bddb5f5bd9047206b65 |
| institution | Kabale University |
| issn | 2214-157X |
| language | English |
| publishDate | 2025-02-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Case Studies in Thermal Engineering |
| spelling | doaj-art-d3b0a65681be4bddb5f5bd9047206b652025-02-02T05:27:28ZengElsevierCase Studies in Thermal Engineering2214-157X2025-02-0166105790Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515]Mohammed Almatrafi0Mohamed Ali Belaïd1Corresponding author.; Umm Al-Qura University, College of Engineering Al-Leith, P.O. Box 715, 21955, Makkah, Saudi ArabiaUmm Al-Qura University, College of Engineering Al-Leith, P.O. Box 715, 21955, Makkah, Saudi Arabiahttp://www.sciencedirect.com/science/article/pii/S2214157X25000504 |
| spellingShingle | Mohammed Almatrafi Mohamed Ali Belaïd Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515] Case Studies in Thermal Engineering |
| title | Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515] |
| title_full | Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515] |
| title_fullStr | Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515] |
| title_full_unstemmed | Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515] |
| title_short | Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515] |
| title_sort | corrigendum to numerical and experimental investigation of temperature dependence vs mobility degradation on i v characteristics in n ldmos structure case stud therm eng 59 july 2024 104515 |
| url | http://www.sciencedirect.com/science/article/pii/S2214157X25000504 |
| work_keys_str_mv | AT mohammedalmatrafi corrigendumtonumericalandexperimentalinvestigationoftemperaturedependencevsmobilitydegradationonivcharacteristicsinnldmosstructurecasestudthermeng59july2024104515 AT mohamedalibelaid corrigendumtonumericalandexperimentalinvestigationoftemperaturedependencevsmobilitydegradationonivcharacteristicsinnldmosstructurecasestudthermeng59july2024104515 |