Gao, L., Zhong, Z., Zhang, Q., Li, X., Xiong, X., Chen, S., . . . Liu, X. Stability of GaN HEMT Device Under Static and Dynamic Gate Stress. IEEE.
Chicago Style (17th ed.) CitationGao, Linfei, et al. Stability of GaN HEMT Device Under Static and Dynamic Gate Stress. IEEE.
MLA (9th ed.) CitationGao, Linfei, et al. Stability of GaN HEMT Device Under Static and Dynamic Gate Stress. IEEE.
Warning: These citations may not always be 100% accurate.