Analysis of GAA Junction Less NS FET Towards Analog and RF Applications at 30 nm Regime
This research focuses on a quantum model created using an entirely novel nanosheet FET. The standard model describes the performance of a Gate-all-around (GAA) Junction-less (JL) nanosheet device with a gate dielectric of SiO<sub>2</sub> and HfO<sub>2</sub>, each having a thi...
Saved in:
Main Authors: | , , , , , , , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
IEEE
2024-01-01
|
Series: | IEEE Open Journal of Nanotechnology |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10433722/ |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | This research focuses on a quantum model created using an entirely novel nanosheet FET. The standard model describes the performance of a Gate-all-around (GAA) Junction-less (JL) nanosheet device with a gate dielectric of SiO<sub>2</sub> and HfO<sub>2</sub>, each having a thickness of 1 nm. The performance of both the classical and quantum models of the GAA nanosheet device is evaluated using the visual TCAD tool, which measures the <italic>I<sub>ON</sub></italic>, <italic>I<sub>OFF</sub></italic>, <italic>I<sub>ON</sub>/ I<sub>OFF</sub></italic>, threshold voltage, DIBL, gain parameters (g<sub>m</sub>, g<sub>d</sub>, A<sub>v</sub>), gate capacitance, and cut-off frequency (<italic>f<sub>T</sub></italic>). The device is suited for applications needing rapid switching since it has a low gate capacitance of the order of 10<sup>–18</sup>, according to the simulation results. A transconductance (g<sub>m</sub>) value of 21 µS and an impressive cut-off frequency of 9.03 GHz are displayed during device analysis. A detailed investigation has also been done into the P-type device response for the same device. Finally, the proposed GAA nanosheet device is used in the inverter model. The NSFET-based inverter, although having higher gate capacitance, has the shortest propagation latency. |
---|---|
ISSN: | 2644-1292 |