Non-Destructive Detection of External Defects in Potatoes Using Hyperspectral Imaging and Machine Learning

For potato external defect detection, ordinary spectral technology has limitations in detail detection and processing accuracy, while the machine vision method has the limitation of a long feedback time. To realize accurate and rapid external defect detection for red-skin potatoes, a non-destructive...

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Bibliographic Details
Main Authors: Ping Zhao, Xiaojian Wang, Qing Zhao, Qingbing Xu, Yiru Sun, Xiaofeng Ning
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Agriculture
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Online Access:https://www.mdpi.com/2077-0472/15/6/573
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