2D mapping of plane stress crack-tip fields following an overload

The evolution of crack-tip strain fields in a thin (plane stress) compact tension sample following an overload (OL) event has been studied using two different experimental techniques. Surface behaviour has been characterised by Digital Image Correlation (DIC), while the bulk behaviour has been cha...

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Bibliographic Details
Main Authors: P. J. Withers, P. Lopez-Crespo, M. Mostafavi, A. Steuwer, J. F. Kelleher, T. Buslaps
Format: Article
Language:English
Published: Gruppo Italiano Frattura 2015-07-01
Series:Fracture and Structural Integrity
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Online Access:http://www.gruppofrattura.it/pdf/rivista/numero33/numero_33_art_19.pdf
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