Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion
Background. The study of materials using polarized radiation allows one to obtain additional information about the properties of the material due to the vector nature of the electromagnetic field. In this regard, the most widely used method is the ellipsometric method for analyzing the optical prope...
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Povolzhskiy State University of Telecommunications & Informatics
2024-12-01
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| Series: | Физика волновых процессов и радиотехнические системы |
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| Online Access: | https://journals.ssau.ru/pwp/article/viewFile/28175/11058 |
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| author | Valeriy V. Yatsyshen Irina I. Borodina |
| author_facet | Valeriy V. Yatsyshen Irina I. Borodina |
| author_sort | Valeriy V. Yatsyshen |
| collection | DOAJ |
| description | Background. The study of materials using polarized radiation allows one to obtain additional information about the properties of the material due to the vector nature of the electromagnetic field. In this regard, the most widely used method is the ellipsometric method for analyzing the optical properties of materials. The use of circularly polarized light carries additional information due to the change in the polarization ellipse upon reflection. Aim. The paper presents the results of calculations of the frequency and angular spectra of the ellipsometric parameters of reflected light for a CdS semiconductor crystal near the exciton resonance, taking into account spatial dispersion. Methods. Spatial dispersion leads to the appearance of additional waves in the medium, which requires the use of additional boundary conditions to uniquely solve the problem of light reflection from such a medium. From Maxwell’s equations a dispersion equation is derived, which in the case of p-polarized radiation leads to the existence of three waves, one of which is longitudinal. Taking into account the complete system of boundary conditions, the problem of reflection and transmission is solved. Results. It is shown that ellipsometric parameters are highly sensitive to the characteristics of a medium with spatial dispersion and can serve to interpret experimental data. It was found that when circularly polarized light is reflected from a medium with spatial dispersion, the nature of the polarization ellipse can change from left-handed circular to right-handed elliptical polarization, which can serve as an additional source of information about the semiconductor crystal near the exciton resonance. Conclusion. The use of the ellipsometric method in conjunction with elliptically polarized radiation makes it possible to study media with spatial dispersion in more detail. |
| format | Article |
| id | doaj-art-be661a4d51b348509031edf405188a76 |
| institution | Kabale University |
| issn | 1810-3189 2782-294X |
| language | English |
| publishDate | 2024-12-01 |
| publisher | Povolzhskiy State University of Telecommunications & Informatics |
| record_format | Article |
| series | Физика волновых процессов и радиотехнические системы |
| spelling | doaj-art-be661a4d51b348509031edf405188a762025-01-20T21:08:59ZengPovolzhskiy State University of Telecommunications & InformaticsФизика волновых процессов и радиотехнические системы1810-31892782-294X2024-12-01274404910.18469/1810-3189.2024.27.4.40-498897Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersionValeriy V. Yatsyshen0https://orcid.org/0000-0003-4185-2333Irina I. Borodina1https://orcid.org/0009-0008-4207-0660Volgograd State UniversityVolgograd State UniversityBackground. The study of materials using polarized radiation allows one to obtain additional information about the properties of the material due to the vector nature of the electromagnetic field. In this regard, the most widely used method is the ellipsometric method for analyzing the optical properties of materials. The use of circularly polarized light carries additional information due to the change in the polarization ellipse upon reflection. Aim. The paper presents the results of calculations of the frequency and angular spectra of the ellipsometric parameters of reflected light for a CdS semiconductor crystal near the exciton resonance, taking into account spatial dispersion. Methods. Spatial dispersion leads to the appearance of additional waves in the medium, which requires the use of additional boundary conditions to uniquely solve the problem of light reflection from such a medium. From Maxwell’s equations a dispersion equation is derived, which in the case of p-polarized radiation leads to the existence of three waves, one of which is longitudinal. Taking into account the complete system of boundary conditions, the problem of reflection and transmission is solved. Results. It is shown that ellipsometric parameters are highly sensitive to the characteristics of a medium with spatial dispersion and can serve to interpret experimental data. It was found that when circularly polarized light is reflected from a medium with spatial dispersion, the nature of the polarization ellipse can change from left-handed circular to right-handed elliptical polarization, which can serve as an additional source of information about the semiconductor crystal near the exciton resonance. Conclusion. The use of the ellipsometric method in conjunction with elliptically polarized radiation makes it possible to study media with spatial dispersion in more detail.https://journals.ssau.ru/pwp/article/viewFile/28175/11058spatial dispersionadditional boundary conditionsexciton resonanceellipsometric methodcircular and elliptical polarization of light |
| spellingShingle | Valeriy V. Yatsyshen Irina I. Borodina Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion Физика волновых процессов и радиотехнические системы spatial dispersion additional boundary conditions exciton resonance ellipsometric method circular and elliptical polarization of light |
| title | Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion |
| title_full | Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion |
| title_fullStr | Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion |
| title_full_unstemmed | Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion |
| title_short | Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion |
| title_sort | reflection of circularly polarized light from a cds semiconductor crystal near the exciton resonance taking into account spatial dispersion |
| topic | spatial dispersion additional boundary conditions exciton resonance ellipsometric method circular and elliptical polarization of light |
| url | https://journals.ssau.ru/pwp/article/viewFile/28175/11058 |
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