Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion
Background. The study of materials using polarized radiation allows one to obtain additional information about the properties of the material due to the vector nature of the electromagnetic field. In this regard, the most widely used method is the ellipsometric method for analyzing the optical prope...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Povolzhskiy State University of Telecommunications & Informatics
2024-12-01
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| Series: | Физика волновых процессов и радиотехнические системы |
| Subjects: | |
| Online Access: | https://journals.ssau.ru/pwp/article/viewFile/28175/11058 |
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