Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments
Experimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electri...
Saved in:
Main Authors: | F. Müller, M. Wolf |
---|---|
Format: | Article |
Language: | English |
Published: |
Wiley
1988-01-01
|
Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/1988/54096 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Electrical Conduction by Percolation in Thick Film Resistors
by: M. Prudenziati, et al.
Published: (1976-01-01) -
Conduction Processes in Thick Film Resistors. Part I
by: M. P. Ansell
Published: (1976-01-01) -
Conduction Processes in Thick Film Resistors. Part II
by: M. P. Ansell
Published: (1976-01-01) -
A Simulative Approach to Electron Conduction in Thick-Film Resistors
by: A. Rizzi, et al.
Published: (1983-01-01) -
Current Noise of Resin Type and Cermet Type Thick Film Resistors
by: Tien-Shou Wu, et al.
Published: (1980-01-01)