Bringing Machine Learning Classifiers Into Critical Cyber-Physical Systems: A Matter of Design
Machine Learning (ML) models are increasingly used by domain experts to tackle classification tasks, aiming for high predictive accuracy. However, classifiers are inherently prone to misclassifications, especially when they encounter unfamiliar, previously unseen or out-of-distribution input data. T...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10994486/ |
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