The Impact of Carbon on Electronic Structure of N-Doped ZnO Films: Scanning Photoelectron Microscopy Study and DFT Calculations

The Impact of Carbon on Electronic Structure of N-Doped ZnO Films: Scanning Photoelectron Microscopy Study and DFT Calculations

A Scanning Photoelectron Microscopy (SPEM) experiment has been applied to ZnO:N films deposited by Atomic Layer Deposition (ALD) under O-rich conditions and post-growth annealed in oxygen at 800 °C. <i>State-of-the-Art</i> spatial resolution (130 nm) allows for probing the electronic str...

Full description

Saved in:
Bibliographic Details
Main Authors: Elzbieta Guziewicz, Sushma Mishra, Matteo Amati, Luca Gregoratti, Oksana Volnianska
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Nanomaterials
Subjects:
zinc oxide
p-type doping
photoelectron spectroscopy
Density Functional Theory calculations
Online Access:https://www.mdpi.com/2079-4991/15/1/30
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://www.mdpi.com/2079-4991/15/1/30

Similar Items