Detection Method of Apple Alternaria Leaf Spot Based on Deep-Semi-NMF
[Objective]Apple Alternaria leaf spot can easily lead to premature defoliation of apple tree leaves, thereby affecting the quality and yield of apples. Consequently, accurately detecting of the disease has become a critical issue in the precise prevention and control of apple tree diseases. Due to f...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Editorial Office of Smart Agriculture
2024-11-01
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| Series: | 智慧农业 |
| Subjects: | |
| Online Access: | https://www.smartag.net.cn/CN/rich_html/10.12133/j.smartag.SA202409001 |
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