Detection Method of Apple Alternaria Leaf Spot Based on Deep-Semi-NMF

Detection Method of Apple Alternaria Leaf Spot Based on Deep-Semi-NMF

[Objective]Apple Alternaria leaf spot can easily lead to premature defoliation of apple tree leaves, thereby affecting the quality and yield of apples. Consequently, accurately detecting of the disease has become a critical issue in the precise prevention and control of apple tree diseases. Due to f...

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Bibliographic Details
Main Authors: FU Zhuojun, HU Zheng, DENG Yangjun, LONG Chenfeng, ZHU Xinghui
Format: Article
Language:English
Published: Editorial Office of Smart Agriculture 2024-11-01
Series:智慧农业
Subjects:
image segment
apple alternaria leaf spot
anomaly detection
deep semi-nonnegative matrix factorization
mahalanobis distance
Online Access:https://www.smartag.net.cn/CN/rich_html/10.12133/j.smartag.SA202409001
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