Comparison and Optimization of Generalized Stamping Machine Fault Diagnosis Models Using Various Transfer Learning Methodologies

The integration of artificial intelligence (AI) with stamping technology has become increasingly critical in smart manufacturing, driven by advancements in both fields. Total clearance, a crucial determinant of both process and product quality in stamping operations, significantly impacts cutting pr...

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Bibliographic Details
Main Authors: Po-Wen Hwang, Yuan-Jen Chang, Hsieh-Chih Tsai, Yu-Ta Tu, Hung-Pin Yang
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/25/6/1779
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