Using SDPC for Visual Exploratory Analysis of Semiconductor Production Line Sensor Data
Vast amounts of data are continuously collected through sensors fitted into various pieces of equipment and processes in semiconductor production lines. These integrated datasets often encompass tens of thousands of dimensions, making it challenging to identify complex relationships among data dimen...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-03-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/25/7/1984 |
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