Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems
As CMOS technology scales down to nanotechnologies, reliability continues to be a decisive subject in the design entry of nanotechnology-based circuit systems. As a result, several computational methodologies have been proposed to evaluate reliability of those circuit systems. However, the process o...
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| Format: | Article |
| Language: | English |
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Wiley
2014-01-01
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| Series: | Journal of Electrical and Computer Engineering |
| Online Access: | http://dx.doi.org/10.1155/2014/410758 |
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| author | N. S. S. Singh |
| author_facet | N. S. S. Singh |
| author_sort | N. S. S. Singh |
| collection | DOAJ |
| description | As CMOS technology scales down to nanotechnologies, reliability continues to be a decisive subject in the design entry of nanotechnology-based circuit systems. As a result, several computational methodologies have been proposed to evaluate reliability of those circuit systems. However, the process of computing reliability has become very time consuming and troublesome as the computational complexity grows exponentially with the dimension of circuit systems. Therefore, being able to speed up the task of reliability analysis is fast becoming necessary in designing modern logic integrated circuits. For this purpose, the paper firstly looks into developing a MATLAB-based automated reliability tool by incorporating the generalized form of the existing computational approaches that can be found in the current literature. Secondly, a comparative study involving those existing computational approaches is carried out on a set of standard benchmark test circuits. Finally, the paper continues to find the exact error bound for individual faulty gates as it plays a significant role in the reliability of circuit systems. |
| format | Article |
| id | doaj-art-a267bfd9b7d64d9e96622f84e2c32d3d |
| institution | Kabale University |
| issn | 2090-0147 2090-0155 |
| language | English |
| publishDate | 2014-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Journal of Electrical and Computer Engineering |
| spelling | doaj-art-a267bfd9b7d64d9e96622f84e2c32d3d2025-02-03T01:20:46ZengWileyJournal of Electrical and Computer Engineering2090-01472090-01552014-01-01201410.1155/2014/410758410758Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit SystemsN. S. S. Singh0Fundamental and Applied Sciences Department, Universiti Teknologi PETRONAS, Bandar Seri Iskandar, 31750 Tronoh, Perak, MalaysiaAs CMOS technology scales down to nanotechnologies, reliability continues to be a decisive subject in the design entry of nanotechnology-based circuit systems. As a result, several computational methodologies have been proposed to evaluate reliability of those circuit systems. However, the process of computing reliability has become very time consuming and troublesome as the computational complexity grows exponentially with the dimension of circuit systems. Therefore, being able to speed up the task of reliability analysis is fast becoming necessary in designing modern logic integrated circuits. For this purpose, the paper firstly looks into developing a MATLAB-based automated reliability tool by incorporating the generalized form of the existing computational approaches that can be found in the current literature. Secondly, a comparative study involving those existing computational approaches is carried out on a set of standard benchmark test circuits. Finally, the paper continues to find the exact error bound for individual faulty gates as it plays a significant role in the reliability of circuit systems.http://dx.doi.org/10.1155/2014/410758 |
| spellingShingle | N. S. S. Singh Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems Journal of Electrical and Computer Engineering |
| title | Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems |
| title_full | Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems |
| title_fullStr | Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems |
| title_full_unstemmed | Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems |
| title_short | Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems |
| title_sort | programmed tool for quantifying reliability and its application in designing circuit systems |
| url | http://dx.doi.org/10.1155/2014/410758 |
| work_keys_str_mv | AT nsssingh programmedtoolforquantifyingreliabilityanditsapplicationindesigningcircuitsystems |