Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems
As CMOS technology scales down to nanotechnologies, reliability continues to be a decisive subject in the design entry of nanotechnology-based circuit systems. As a result, several computational methodologies have been proposed to evaluate reliability of those circuit systems. However, the process o...
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2014-01-01
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| Series: | Journal of Electrical and Computer Engineering |
| Online Access: | http://dx.doi.org/10.1155/2014/410758 |
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