Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy
Fourier ptychographic microscopy (FPM) is a recently developed microscope technology that overcomes the resolution limit of a low numerical aperture objective lens by employing angular varying illuminations. Combining the concepts of ptychography, synthetic aperture, and phase retrieval, FPM achieve...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8166728/ |
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