Numerical Simulation and Mathematical Modeling of 3D DG SOI MOSFET with the Influence of Biasing with Back Gate

Design consideration of a fully depleted SOI (Silicon-On-Insulator) MOSFET device by three dimensional mathematical modeling is presented in this paper. To the best of our knowledge, when our device is fabricated in nanometer regime, the threshold voltage changes due to various effects. Back gate vo...

Full description

Saved in:
Bibliographic Details
Main Authors: Neha Goel, Manoj Kumar Pandey
Format: Article
Language:English
Published: Sumy State University 2017-10-01
Series:Журнал нано- та електронної фізики
Subjects:
Online Access:http://jnep.sumdu.edu.ua:8080/download/numbers/2017/5/articles/Proof_JNEP_05002.pdf
Tags: Add Tag
No Tags, Be the first to tag this record!