High-performance 2D electronic devices enabled by strong and tough two-dimensional polymer with ultra-low dielectric constant
Abstract As the feature size of microelectronic circuits is scaling down to nanometer order, the increasing interconnect crosstalk, resistance-capacitance (RC) delay and power consumption can limit the chip performance and reliability. To address these challenges, new low-k dielectric (k < 2) mat...
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Main Authors: | , , , , , , , , , , , , , , , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Nature Portfolio
2024-12-01
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Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-024-53935-6 |
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