A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials

A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials

The effective knowledge of emissivity is pivotal to obtain reliable temperature measurements through non-contact techniques like pyrometry and thermal imaging. This is fundamental in high-temperature applications since material emissivity strongly depends on temperature conditions. Given the recent...

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Bibliographic Details
Main Authors: Gloria Cosoli, Paolo Chiariotti, Beatriz García-Baños, Giuseppe Pandarese, Felipe L. Peñaranda-Foix, Gian Marco Revel
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Sensors
Subjects:
emissivity
material characterization
high-emissivity materials
microwave
uncertainty analysis
Online Access:https://www.mdpi.com/1424-8220/25/2/487
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