A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials

The effective knowledge of emissivity is pivotal to obtain reliable temperature measurements through non-contact techniques like pyrometry and thermal imaging. This is fundamental in high-temperature applications since material emissivity strongly depends on temperature conditions. Given the recent...

Full description

Saved in:
Bibliographic Details
Main Authors: Gloria Cosoli, Paolo Chiariotti, Beatriz García-Baños, Giuseppe Pandarese, Felipe L. Peñaranda-Foix, Gian Marco Revel
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/25/2/487
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1832587506103615488
author Gloria Cosoli
Paolo Chiariotti
Beatriz García-Baños
Giuseppe Pandarese
Felipe L. Peñaranda-Foix
Gian Marco Revel
author_facet Gloria Cosoli
Paolo Chiariotti
Beatriz García-Baños
Giuseppe Pandarese
Felipe L. Peñaranda-Foix
Gian Marco Revel
author_sort Gloria Cosoli
collection DOAJ
description The effective knowledge of emissivity is pivotal to obtain reliable temperature measurements through non-contact techniques like pyrometry and thermal imaging. This is fundamental in high-temperature applications since material emissivity strongly depends on temperature conditions. Given the recent attention in high-temperature applications, especially for replacing fossil-fuel-dependent heating with greener solutions in energy-intensive processes, renewed interest in characterizing materials radiant properties rose. This work presents a measurement procedure for characterizing the total emissivity of high-emissivity materials exploiting microwaves for heating the test material. The procedure grounds on a sequential approach, using a reference material of known emissivity (e.g., high-emissivity coating, already characterized sample holder, etc.) to derive the target material total emissivity. Uncertainty analysis is performed to provide a metrological characterization of the approach. The procedure is validated on target materials of known emissivity, focusing on high-emissivity materials commonly employed in microwave heating processes. Results are compatible with reference literature and material datasheets, demonstrating the validity of the proposed approach.
format Article
id doaj-art-851a3e441d2d4cb2a32fd1fcf9cc702b
institution Kabale University
issn 1424-8220
language English
publishDate 2025-01-01
publisher MDPI AG
record_format Article
series Sensors
spelling doaj-art-851a3e441d2d4cb2a32fd1fcf9cc702b2025-01-24T13:49:06ZengMDPI AGSensors1424-82202025-01-0125248710.3390/s25020487A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity MaterialsGloria Cosoli0Paolo Chiariotti1Beatriz García-Baños2Giuseppe Pandarese3Felipe L. Peñaranda-Foix4Gian Marco Revel5Department of Theoretical and Applied Sciences, eCampus University, 22060 Novedrate, ItalyDepartment of Mechanical Engineering, Politecnico di Milano, 20156 Milan, ItalyITACA Institute, Universitat Politècnica de València, 46022 Valencia, SpainDepartment of Industrial Engineering and Mathematical Sciences, Università Politecnica delle Marche, 60131 Ancona, ItalyITACA Institute, Universitat Politècnica de València, 46022 Valencia, SpainDepartment of Industrial Engineering and Mathematical Sciences, Università Politecnica delle Marche, 60131 Ancona, ItalyThe effective knowledge of emissivity is pivotal to obtain reliable temperature measurements through non-contact techniques like pyrometry and thermal imaging. This is fundamental in high-temperature applications since material emissivity strongly depends on temperature conditions. Given the recent attention in high-temperature applications, especially for replacing fossil-fuel-dependent heating with greener solutions in energy-intensive processes, renewed interest in characterizing materials radiant properties rose. This work presents a measurement procedure for characterizing the total emissivity of high-emissivity materials exploiting microwaves for heating the test material. The procedure grounds on a sequential approach, using a reference material of known emissivity (e.g., high-emissivity coating, already characterized sample holder, etc.) to derive the target material total emissivity. Uncertainty analysis is performed to provide a metrological characterization of the approach. The procedure is validated on target materials of known emissivity, focusing on high-emissivity materials commonly employed in microwave heating processes. Results are compatible with reference literature and material datasheets, demonstrating the validity of the proposed approach.https://www.mdpi.com/1424-8220/25/2/487emissivitymaterial characterizationhigh-emissivity materialsmicrowaveuncertainty analysis
spellingShingle Gloria Cosoli
Paolo Chiariotti
Beatriz García-Baños
Giuseppe Pandarese
Felipe L. Peñaranda-Foix
Gian Marco Revel
A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials
Sensors
emissivity
material characterization
high-emissivity materials
microwave
uncertainty analysis
title A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials
title_full A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials
title_fullStr A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials
title_full_unstemmed A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials
title_short A Measurement Approach for Characterizing Temperature-Related Emissivity Variability in High-Emissivity Materials
title_sort measurement approach for characterizing temperature related emissivity variability in high emissivity materials
topic emissivity
material characterization
high-emissivity materials
microwave
uncertainty analysis
url https://www.mdpi.com/1424-8220/25/2/487
work_keys_str_mv AT gloriacosoli ameasurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT paolochiariotti ameasurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT beatrizgarciabanos ameasurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT giuseppepandarese ameasurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT felipelpenarandafoix ameasurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT gianmarcorevel ameasurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT gloriacosoli measurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT paolochiariotti measurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT beatrizgarciabanos measurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT giuseppepandarese measurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT felipelpenarandafoix measurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials
AT gianmarcorevel measurementapproachforcharacterizingtemperaturerelatedemissivityvariabilityinhighemissivitymaterials