THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES
Metrological features of photovoltaic semiconductor converters (PSC) based on semiconductors with the multiple-charge impurities are investigated in a wide range of power densities of optical radiation. The algorithm of the measurement procedure of the metrological characteristics of PSC is introduc...
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| Format: | Article |
| Language: | English |
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Belarusian National Technical University
2015-04-01
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| Series: | Приборы и методы измерений |
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| Online Access: | https://pimi.bntu.by/jour/article/view/146 |
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| author | O. K. Gusev A. I. Svistun L. I. Shadurskaya N. V. Yarjembitskaya |
| author_facet | O. K. Gusev A. I. Svistun L. I. Shadurskaya N. V. Yarjembitskaya |
| author_sort | O. K. Gusev |
| collection | DOAJ |
| description | Metrological features of photovoltaic semiconductor converters (PSC) based on semiconductors with the multiple-charge impurities are investigated in a wide range of power densities of optical radiation. The algorithm of the measurement procedure of the metrological characteristics of PSC is introduced not only at low densities of optical power, but at high, taking into account the boundary of nonlinear recombination. The estimation of accuracy of feature finding of the metrological characteristics PSC based on semiconductors with the multiple-charge impurities, is carried out, taking into consideration the area of nonlinear recombination. |
| format | Article |
| id | doaj-art-8388038c33b0405588e31051a25b3eba |
| institution | Kabale University |
| issn | 2220-9506 2414-0473 |
| language | English |
| publishDate | 2015-04-01 |
| publisher | Belarusian National Technical University |
| record_format | Article |
| series | Приборы и методы измерений |
| spelling | doaj-art-8388038c33b0405588e31051a25b3eba2025-02-03T05:16:53ZengBelarusian National Technical UniversityПриборы и методы измерений2220-95062414-04732015-04-010299103140THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIESO. K. Gusev0A. I. Svistun1L. I. Shadurskaya2N. V. Yarjembitskaya3Belarusian National Technical UniversityBelarusian National Technical UniversityBelarusian National Technical UniversityBelarusian National Technical UniversityMetrological features of photovoltaic semiconductor converters (PSC) based on semiconductors with the multiple-charge impurities are investigated in a wide range of power densities of optical radiation. The algorithm of the measurement procedure of the metrological characteristics of PSC is introduced not only at low densities of optical power, but at high, taking into account the boundary of nonlinear recombination. The estimation of accuracy of feature finding of the metrological characteristics PSC based on semiconductors with the multiple-charge impurities, is carried out, taking into consideration the area of nonlinear recombination.https://pimi.bntu.by/jour/article/view/146photovoltaic semiconductor convertersmetrological characteristicsmultiple-charge impurities |
| spellingShingle | O. K. Gusev A. I. Svistun L. I. Shadurskaya N. V. Yarjembitskaya THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES Приборы и методы измерений photovoltaic semiconductor converters metrological characteristics multiple-charge impurities |
| title | THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES |
| title_full | THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES |
| title_fullStr | THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES |
| title_full_unstemmed | THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES |
| title_short | THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES |
| title_sort | identification algorithm of metrological characteristics of wide range photovoltaic semiconductor converters with multiply impurities |
| topic | photovoltaic semiconductor converters metrological characteristics multiple-charge impurities |
| url | https://pimi.bntu.by/jour/article/view/146 |
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