Evaluating the Capture Efficiency of Microchannel Plates Through Photoelectron Detection
Capture efficiency (CE) is a critical performance parameter for microchannel plates (MCPs), yet its accurate measurement remains challenging. In this study, we propose an innovative method for evaluating the CE of newly fabricated MCPs based on the detection of a photoelectron beam generated by UV l...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-06-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/15/11/6301 |
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