IC-GraF: An Improved Clustering with Graph-Embedding-Based Features for Software Defect Prediction
Software defect prediction (SDP) has been a prominent area of research in software engineering. Previous SDP methods often struggled in industrial applications, primarily due to the need for sufficient historical data. Thus, clustering-based unsupervised defect prediction (CUDP) and cross-project de...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2024-01-01
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| Series: | IET Software |
| Online Access: | http://dx.doi.org/10.1049/2024/8027037 |
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