Nanoscale Resist‐Free Patterning of Halogenated Zeolitic Imidazolate Frameworks by Extreme UV Lithography

Abstract Advancements in patterning techniques for metal–organic frameworks (MOFs) are crucial for their integration into microelectronics. However, achieving precise nanoscale control of MOF structures remains challenging. In this work, a resist‐free method for patterning MOFs is demonstrated using...

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Bibliographic Details
Main Authors: Weina Li, Tianlei Ma, Pengyi Tang, Yunhong Luo, Hui Zhang, Jun Zhao, Rob Ameloot, Min Tu
Format: Article
Language:English
Published: Wiley 2025-04-01
Series:Advanced Science
Subjects:
Online Access:https://doi.org/10.1002/advs.202415804
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