Statistical evaluation of morphological parameters of porous nanostructures on the synthesized indium phosphide surface

A constructive method for estimating the surface morphology of nanostructured semiconductors, which consists in determining the main statistical characteristics of the aggregate structure of nanoscale objects on their synthesized surface is presented. In terms of the indium phosphide semiconductor...

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Bibliographic Details
Main Authors: Н.И. Косач, В.Б. Большаков, И.Т. Богданов, Я.А. Сычикова
Format: Article
Language:English
Published: Academician Ye.A. Buketov Karaganda University 2021-09-01
Series:Қарағанды университетінің хабаршысы. Физика сериясы
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Online Access:https://phs.buketov.edu.kz/index.php/physics-vestnik/article/view/430
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