Compressional residual stress in Bastogne boudins revealed by synchrotron X‐ray microdiffraction

Abstract Lattice distortions in crystals can be mapped at the micron scale using synchrotron X‐ray Laue microdiffraction (μXRD). From lattice distortions the shape and orientation of the elastic strain tensor can be derived and interpreted in terms of residual stress. Here we apply the new method to...

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Bibliographic Details
Main Authors: Kai Chen, Martin Kunz, Yao Li, Eloisa Zepeda‐Alarcon, Manuel Sintubin, Hans‐Rudolf Wenk
Format: Article
Language:English
Published: Wiley 2016-06-01
Series:Geophysical Research Letters
Subjects:
Online Access:https://doi.org/10.1002/2016GL069236
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