Einstein frequency of individual chalcogen bonds in Cu(In,Ga)Se2 and Cu(In,Ga)S2: Indicator of diffusion property of Cu, In, and Ga atoms

Einstein frequency of individual chalcogen bonds in Cu(In,Ga)Se2 and Cu(In,Ga)S2: Indicator of diffusion property of Cu, In, and Ga atoms

Elucidating the characteristics of the Cu-Se, In-Se, and Ga-Se bonds in chalcopyrite-type Cu(In,Ga)Se2-based semiconductors can aid the design and fabrication of highly efficient thin-film photovoltaic devices. In this study, we used extended X-ray absorption fine structure (EXAFS) analyses to evalu...

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Bibliographic Details
Main Authors: Kosuke Beppu, Fumiaki Amano, Seiji Yamazoe, Takahiro Wada
Format: Article
Language:English
Published: Elsevier 2025-04-01
Series:Next Materials
Subjects:
Low-temperature XAFS
Cu(In,Ga)Se2
Cu(In,Ga)S2
Force constant
Atomic diffusion
Online Access:http://www.sciencedirect.com/science/article/pii/S2949822824003411
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