Structure and Elemental Composition of Pb1 – xSnxS Films
In this paper by the methods of diffractometry, scanning and atomic force microscopy, X-ray characteristic radiation induced by focused proton beam (PIXE), Rutherford backscattering of helium-4 ions we have investigated Pb1 – xSnxS films obtained by "hot wall". It was found that layers obt...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2015-06-01
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| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2015/2/articles/jnep_2015_V7_02013.pdf |
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